Semiconductors -- July 2000
Volume 34, Issue 7,
pp. 741-860
ATOMIC STRUCTURE AND NONELECTRONIC PROPERTIES OF SEMICONDUCTORS
Investigation of Distribution and Redistribution of Silicon in Thin Doped Gallium-Arsenide Layers Grown by Molecular Beam Epitaxy on Substrates with (100), (111)Ga, and (111)As Orientations
G. B. Galiev, V. É. Kaminskii, V. G. Mokerov, V. K. Nevolin, V. V. Saraikin, and Yu. V. Slepnev
pp. 741-745
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ELECTRONIC AND OPTICAL PROPERTIES OF SEMICONDUCTORS
The Magnetoresistance of Compensated Ge:As at Microwave Frequencies in the Vicinity of the MetalInsulator Phase Transition
A. I. Veinger, A. G. Zabrodskii, and T. V. Tisnek
pp. 746-754
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The Role of Nonequilibrium Carriers in Linear Charge Transport (Ohm's Law)
Yu. G. Gurevich, G. N. Logvinov, G. Espejo, O. Yu. Titov, and A. Meriuts
pp. 755-758
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Liquid Phase Reflectivity under Conditions of Laser-Induced Silicon Melting
G. D. Ivlev and E. I. Gatskevich
pp. 759-762
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Far Infrared Stimulated and Spontaneous Radiation in Uniaxially Deformed Zero-Gap Hg1 xCdxTe
E. F. Venger, S. G. Gasan-zade, M. V. Strikha, S. V. Staryi, and G. A. Shepel'skii
pp. 763-767
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Hysteresis of Magnetoresistance in Neutron-Transmutation-Doped Ge in the Region of Hopping Transport over the Coulomb-Gap States
A. G. Andreev, S. V. Egorov, A. G. Zabrodskii, R. V. Parfen'ev, and A. V. Chernyaev
pp. 768-774
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SEMICONDUCTOR STRUCTURES, INTERFACES, AND SURFACES
The Role of Impact Ionization in the Formation of Reverse CurrentVoltage Characteristics of AlSiO2n-Si Tunnel Structures
M. I. Vexler, I. V. Grekhov, and A. F. Shulekin
pp. 775-780
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Photosensitivity of Structures Based on ZnSe Single Crystals
G. A. Il'chuk, V. Yu. Rud', Yu. V. Rud', R. N. Bekimbetov, V. I. Ivanov-Omskii, and N. A. Ukrainets
pp. 781-785
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Analysis of Charges and Surface States at the Interfaces of SemiconductorInsulatorSemiconductor Structures
L. S. Berman, E. I. Belyakova, L. S. Kostina, E. D. Kim, and S. C. Kim
pp. 786-789
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Polarization Photosensitivity of a-Si:H/c-Si Heterojunctions
Yu. A. Nikolaev, V. Yu. Rud', Yu. V. Rud', and E. I. Terukov
pp. 790-793
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Photosensitivity of InSiO2Cd0.28Hg0.72Te Structures with a Nontransparent Field Electrode
V. N. Ovsyuk, V. V. Vasil'ev, and Yu. P. Mashukov
pp. 794-798
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The Hall Effect in Fe Submonolayer Systems on n- and p-type Si(111)
N. G. Galkin, D. L. Goroshko, A. V. Konchenko, E. S. Zakharova, and S. Ts. Krivoshchapov
pp. 799-802
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LOW-DIMENSIONAL SYSTEMS
Negative Differential Conductance and the Bloch Oscillations in the Natural Superlattice of 8H Silicon Carbide Polytype
V. I. Sankin and A. A. Lepneva
pp. 803-806
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Plasma Oscillations in Two-Dimensional Semiconductor Superstructures
S. Yu. Glazov and S. V. Kryuchkov
pp. 807-809
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Study of Multilayer Structures with InAs Nanoobjects in a Silicon Matrix
V. N. Petrov, N. K. Polyakov, V. A. Egorov, G. E. Cirlin, N. D. Zakharov, P. Werner, V. M. Ustinov, D. V. Denisov, N. N. Ledentsov, and Zh. I. Alferov
pp. 810-814
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Impurity Absorption of Light in Confined Systems Subjected to a Longitudinal Magnetic Field
É. P. Sinyavskii and S. M. Sokovnich
pp. 815-816
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Charge Carrier Interference in One-Dimensional Semiconductor Rings
N. T. Bagraev, A. D. Buravlev, V. K. Ivanov, L. E. Klyachkin, A. M. Malyarenko, S. A. Rykov, and I. A. Shelykh
pp. 817-824
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AMORPHOUS, VITREOUS, AND POROUS SEMICONDUCTORS
Simulation of Photochemical Transformations and Photodarkening in Photoresist Films Exposed to Pulsed Vacuum-Ultraviolet Radiation
N. A. Kaliteevskaya and R. P. Seisyan
pp. 825-828
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The Influence of Erbium on Electrical and Photoelectric Properties of Amorphous Silicon Produced by Radio-Frequency Silane Decomposition
E. I. Terukov, M. M. Kazanin, O. I. Kon'kov, V. Kh. Kudoyarova, K. V. Kougiya, Yu. A. Nikulin, and A. G. Kazanskii
pp. 829-834
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PHYSICS OF SEMICONDUCTOR DEVICES
Fringing Field of High-Voltage Planar pin Diodes with a Nonuniformly Doped Guard Ring
A. S. Kyuregyan
pp. 835-843
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Study of the Effect of Graded Gap Epilayers on the Performance of CdxHg1 xTe Photodiodes
V. V. Vasil'ev, D. G. Esaev, A. F. Kravchenko, V. M. Osadchii, and A. O. Suslyakov
pp. 844-847
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InGaAsSb(Gd)/InAsSbP Double Heterostructure Lasers (lambda = 3.03.3 µm) for Diode Laser Spectroscopy
M. Aidaraliev, T. Beyer, N. V. Zotova, S. A. Karandashev, B. A. Matveev, M. A. Remennyi, N. M. Stus', and G. N. Talalakin
pp. 848-852
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Properties of Wide-Mesastripe InGaAsP/InP Lasers
E. G. Golikova, V. A. Kureshov, A. Yu. Leshko, A. V. Lyutetskii, N. A. Pikhtin, Yu. A. Ryaboshtan, G. A. Skrynnikov, I. S. Tarasov, and Zh. I. Alferov
pp. 853-856
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PERSONALIA
Zhores Ivanovich Alferov (dedicated to his 70th birthday)
pp. 857-860
Full Text: PDF (159 kB)