Semiconductors -- January 2000
Volume 34, Issue 1,
pp. 1-121
ATOMIC STRUCTURE AND NONELECTRONIC PROPERTIES OF SEMICONDUCTORS
Holmium Redistribution upon Solid-Phase Epitaxial Crystallization of Amorphized Silicon Layers
O. V. Aleksandrov, Yu. A. Nikolaev, and N. A. Sobolev
pp. 1-5
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Elastic Strain and Composition of Self-Assembled GeSi Nanoislands on Si(001)
N. V. Vostokov, S. A. Gusev, I. V. Dolgov, Yu. N. Drozdov, Z. F. Krasil'nik, D. N. Lobanov, L. D. Moldavskaya, A. V. Novikov, V. V. Postnikov, and D. O. Filatov
pp. 6-10
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ELECTRONIC AND OPTICAL PROPERTIES OF SEMICONDUCTORS
Emission Associated with Extended Defects in Epitaxial ZnTe/GaAs Layers and Multilayer Structures
E. F. Venger, Yu. G. Sadof'ev, G. N. Semenova, N. E. Korsunskaya, V. P. Klad'ko, M. P. Semtsiv, and L. V. Borkovskaya
pp. 11-16
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Evolution of Photoluminescence Spectra of Stoichiometric CdTe: Dependence on the Purity of Starting Components
A. V. Kvit, Yu. V. Klevkov, S. A. Medvedev, V. S. Bagaev, A. V. Perestoronin, and A. F. Plotnikov
pp. 17-20
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Formation of Photoluminescence Centers During Annealing of SiO2 Layers Implanted with Ge Ions
G. A. Kachurin, L. Rebohle, I. E. Tyschenko, V. A. Volodin, M. Voelskow, W. Skorupa, and H. Froeb
pp. 21-26
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Special Features of Electrical Activation of 28Si in Single-Crystal and Epitaxial GaAs Subjected to Rapid Thermal Annealing
V. M. Ardyshev, M. V. Ardyshev, and S. S. Khludkov
pp. 27-31
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Electrophysical Properties of Hg1xCdxTe Crystals under Hydrostatic Pressure
I. V. Virt, V. D. Prozorovskii, and D. I. Tsyutsyura
pp. 32-34
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Band Structure and Spatial Charge Distribution in AlxGa1xN
V. G. Deibuk, A. V. Voznyi, and M. M. Sletov
pp. 35-39
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Field Dependence of the Rate of Thermal Emission of Holes from the VGaSAs Complex in Gallium Arsenide
S. V. Bulyarskii, N. S. Grushko, and A. V. Zhukov
pp. 40-44
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Electron Spin Resonance in the Vicinity of MetalInsulator Transition in Compensated n-Ge:As
A. I. Veinger, A. G. Zabrodskii, and T. V. Tisnek
pp. 45-55
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SEMICONDUCTORS STRUCTURES, INTERFACES, AND SURFACES
Ellipsometric Study of Ultrathin AlxGa1xAs Layers
M. V. Sukhorukova, I. A. Skorokhodova, and V. P. Khvostikov
pp. 56-60
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Transverse Optical Phonon Splitting in GaAs/AlAs Superlattices Grown on the GaAs(311) Surface Studied by the Method of Raman Light Scattering
V. A. Volodin, M. D. Efremov, V. V. Preobrazhenskii, B. R. Semyagin, V. V. Bolotov, and V. A. Sachkov
pp. 61-66
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Dynamic Strain-Sensitive Characteristics of the Schottky-Barrier Diodes under a Pulsed Uniform Pressure
O. O. Mamatkarimov, S. Z. Zainabidinov, A. Abduraimov, R. Kh. Khamidov, and U. A. Tuichiev
pp. 67-69
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Effect of the InsulatorGallium Arsenide Boundary on the Behavior of Silicon in the Course of Radiation Annealing
V. M. Ardyshev, M. V. Ardyshev, and S. S. Khludkov
pp. 70-72
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Temperature Dependence of Residual Stress in Epitaxial GaAs/Si(100) Films Determined from Photoreflectance Spectroscopy Data
R. V. Kuz'menko, A. V. Ganzha, O. V. Bochurova, É. P. Domashevskaya, J. Schreiber, S. Hildebrandt, S. Mo, E. Peiner, and A. Schlachetzki
pp. 73-80
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AMORPHOUS, VITREOUS, AND POROUS SEMICONDUCTORS
Energy Distribution of Localized States in Amorphous Hydrogenated Silicon
K. V. Kougiya, E. I. Terukov, and I. N. Trapeznikova
pp. 81-86
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Modifications of the Structure and Electrical Parameters of the Films of Amorphous Hydrogenated Silicon Implanted with Si+ Ions
O. A. Golikova, A. N. Kuznetsov, V. Kh. Kudoyarova, I. N. Petrov, É. P. Domashevskaya, and V. A. Terekhov
pp. 87-91
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The Influence of Local Surroundings of Er Atoms on the Kinetics of Decay of Er Photoluminescence in Amorphous Hydrogenated Silicon
E. I. Terukov, V. Kh. Kudoyarova, O. I. Kon'kov, E. A. Konstantinova, B. V. Kamenev, and V. Yu. Timoshenko
pp. 92-94
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CrystalGlass Phase Transition Induced by Pulses of Electric Field in Chalcogenide Semiconductors
É. A. Lebedev, K. D. Tséndin, and L. P. Kazakova
pp. 95-97
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Growth of a-C:H and a-C:H Films Produced by Magnetron Sputtering
T. K. Zvonareva, V. I. Ivanov-Omskii, A. V. Nashchekin, and L. V. Sharonova
pp. 98-103
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PHYSICS OF SEMICONDUCTOR DEVICES
Light Emitting Diodes for the Spectral Range of lambda = 3.34.3µm Fabricated from the InGaAs- and InAsSbP-Based Solid Solutions: Electroluminescence in the Temperature Range of 20180°C
M. Aidaraliev, N. V. Zotova, S. A. Karandashev, B. A. Matveev, M. A. Remennyi, N. M. Stus', and G. N. Talalakin
pp. 104-107
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Current Transport in the Menn+ SchottkyBarrier Structures
N. A. Torkhov and S. V. Eremeev
pp. 108-114
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Capacitance Measurements for Diodes in the Case of Strong Dependence of the Diode-Base Series Resistance on the Applied Voltage
A. A. Lebedev, Jr, A. A. Lebedev[dagger], and D. V. Davydov
pp. 115-118
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A Spatially Single-Mode Laser for a Range of 1.251.28µm on the Basis of InAs Quantum Dots on a GaAs Substrate
S. S. Mikhrin, A. E. Zhukov, A. R. Kovsh, N. A. Maleev, V. M. Ustinov, Yu. M. Shernyakov, I. N. Kayander, E. Yu. Kondrat'eva, D. A. Livshits, I. S. Tarasov, M. V. Maksimov, A. F. Tsatsul'nikov, N. N. Ledentsov, P. S. Kop'ev, D. Bimberg, and Zh. I. Alferov
pp. 119-121
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