Semiconductors -- June 2000
Volume 34, Issue 6,
pp. 615-740
ATOMIC STRUCTURE AND NONELECTRONIC PROPERTIES OF SEMICONDUCTORS
Investigation of the Influence of External Effects on the Behavior of Gold Impurity in Silicon
S. Z. Zainabidinov, O. O. Mamatkarimov, I. G. Tursunov, and U. A. Tuichiev
pp. 615-617
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Internal Friction Related to Changes in the Shape of Small Inclusions
Yu. N. Andreev, B. M. Darinskii, V. A. Moshnikov, D. S. Saiko, and N. P. Yaroslavtsev
pp. 618-620
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Specifics of MOCVD Formation of InxGa1 xN Inclusions in a GaN Matrix
I. P. Soshnikov, V. V. Lundin, A. S. Usikov, I. P. Kalmykova, N. N. Ledentsov, A. Rosenauer, B. Neubauer, and D. Gerthsen
pp. 621-625
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ELECTRONIC AND OPTICAL PROPERTIES OF SEMICONDUCTORS
Interband Emission of Cadmium Thiogallate
A. I. Machuga, V. F. Zhitar', and E. D. Arama
pp. 626-628
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Redistribution of Phosphorus Implanted into Silicon Doped Heavily with Boron
E. G. Tishkovskii, V. I. Obodnikov, A. A. Taskin, K. V. Feklistov, and V. G. Seryapin
pp. 629-633
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Multiphonon Capture of Charge Carriers by Deep-Level Centers in a Depletion Region of a Semiconductor
M. A. Dem'yanenko, V. N. Ovsyuk, and V. V. Shashkin
pp. 634-640
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Temperature Dependences of Electrical Properties of n-type PbSe Single-Crystalline Films Subjected to alpha-Particle Bombardment
Ya. P. Salii and R. Ya. Salii
pp. 641-643
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Charge Carrier Mobility in n-CdxHg1 xTe Crystals Subjected to Dynamic Ultrasonic Stressing
A. I. Vlasenko, Ya. M. Olikh, and R. K. Savkina
pp. 644-649
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On the Origin of the ThermalField Asymmetry in Ionic Polarization/Depolarization of Oxide in Si-MOS Structures
E. I. Gol'dman, A. G. Zhdan, and G. V. Chucheva
pp. 650-654
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Equilibrium Energy Distribution of Localized Carriers in Disordered Semiconductors Subjected to an External Electric Field at Low Temperature
D. V. Nikolaenkov, V. I. Arkhipov, and V. R. Nikitenko
pp. 655-657
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Photoelectric Phenomena in a-Si:H/p-CuInSe2 Heterostructures
Yu. A. Nikolaev, V. Yu. Rud', Yu. V. Rud', and E. I. Terukov
pp. 658-661
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SEMICONDUCTOR STRUCTURES, INTERFACES, AND SURFACES
Thermoelectric and Photoelectric Properties of the pn CuInSe2/CdS Heterostructures Obtained by the Quasi-Equilibrium Deposition Method
M.-R. A. Magomedov, Sh. M. Ismailov, Dzh. Kh. Magomedova, and P. P. Khokhlachev
pp. 662-664
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Critical Voltage Growth Rate when Initiating the Ultrafast Impact Ionization Front in a Diode Structure
A. M. Minarskii and P. B. Rodin
pp. 665-667
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Special Features of GenerationRecombination Processes in the pn Junctions Based on HgMnTe
L. A. Kosyachenko, S. É. Ostapov, and Sun Weiguo
pp. 668-670
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Influence of SiO2 Protective Films on the Diffusion of Atomic Hydrogen during the Hydrogenation of Epitaxial n-GaAs
A. V. Panin and N. A. Torkhov
pp. 671-676
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Photosensitivity of a-Si:H/n-InSe Heterocontacts
Yu. A. Nikolaev, V. Yu. Rud', Yu. V. Rud', and E. I. Terukov
pp. 677-679
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Surface Magnetoplasma Waves in a Ferromagnetic Semiconductor and their Excitation by a Magnetic Dipole
V. L. Fal'ko, S. I. Khankina, and V. M. Yakovenko
pp. 680-685
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LOW-DIMENSIONAL SYSTEMS
Reflection Coefficient of a Semiconductor Superlattice Subjected to a Magnetic Field
A. A. Bulgakov and O. V. Shramkova
pp. 686-692
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Low-Temperature Photoluminescence and X-ray Diffractometry Study of InxGa1 xAs Quantum Wells
S. V. Evstigneev, R. M. Imamov, A. A. Lomov, Yu. G. Sadof'ev, Yu. V. Khabarov, M. A. Chuev, and D. S. Shipitsin
pp. 693-699
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Self-Ordered Microcavities Embedded in Ultrashallow Silicon pn Junctions
N. T. Bagraev, A. D. Buravlev, L. E. Klyachkin, A. M. Malyarenko, and S. A. Rykov
pp. 700-711
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Ballistic Conductance of a Quantum Wire at Finite Temperatures
N. T. Bagraev, V. K. Ivanov, L. E. Klyachkin, A. M. Malyarenko, and I. A. Shelykh
pp. 712-716
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AMORPHOUS, VITREOUS, AND POROUS SEMICONDUCTORS
Kinetics of Light-Induced Degradation in a-Si:H Films Investigated by Computer Simulation
M. N. Meytin, M. Zeman, B. G. Budaguan, and J. W. Metselaar
pp. 717-722
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The StaeblerWronski Effect and Temperature Dependences of Photoconductivity in p-type a-Si:H
S. V. Kuznetsov
pp. 723-727
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Modification of Optoelectronic Properties of Porous Silicon Produced in an Electrolyte Based on Heavy Water
B. V. Kamenev, E. A. Konstantinova, P. K. Kashkarov, and V. Yu. Timoshenko
pp. 728-731
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Optical and Electrical Properties of Porous Gallium Arsenide
N. S. Averkiev, L. P. Kazakova, É. A. Lebedev, Yu. V. Rud', A. N. Smirnov, and N. N. Smirnova
pp. 732-736
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Effect of Nanocrystalline Inclusions on the Photosensitivity of Amorphous Hydrogenated Silicon Films
O. A. Golikova and M. M. Kazanin
pp. 737-740
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