Semiconductors -- June 2000
  
Volume 34, Issue 6, 
 pp. 615-740 
ATOMIC STRUCTURE AND NONELECTRONIC PROPERTIES OF SEMICONDUCTORS
Investigation of the Influence of External Effects on the Behavior of Gold Impurity in Silicon
S. Z. Zainabidinov, O. O. Mamatkarimov, I. G. Tursunov, and U. A. Tuichiev
 pp. 615-617
       
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Internal Friction Related to Changes in the Shape of Small Inclusions
Yu. N. Andreev, B. M. Darinskii, V. A. Moshnikov, D. S. Saiko, and N. P. Yaroslavtsev
 pp. 618-620
       
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Specifics of MOCVD Formation of InxGa1  xN Inclusions in a GaN Matrix
I. P. Soshnikov, V. V. Lundin, A. S. Usikov, I. P. Kalmykova, N. N. Ledentsov, A. Rosenauer, B. Neubauer, and D. Gerthsen
 pp. 621-625
       
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ELECTRONIC AND OPTICAL PROPERTIES OF SEMICONDUCTORS
Interband Emission of Cadmium Thiogallate
A. I. Machuga, V. F. Zhitar', and E. D. Arama
 pp. 626-628
       
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Redistribution of Phosphorus Implanted into Silicon Doped Heavily with Boron
E. G. Tishkovskii, V. I. Obodnikov, A. A. Taskin, K. V. Feklistov, and V. G. Seryapin
 pp. 629-633
       
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Multiphonon Capture of Charge Carriers by Deep-Level Centers in a Depletion Region of a Semiconductor
M. A. Dem'yanenko, V. N. Ovsyuk, and V. V. Shashkin
 pp. 634-640
       
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Temperature Dependences of Electrical Properties of n-type PbSe Single-Crystalline Films Subjected to alpha-Particle Bombardment
Ya. P. Salii and R. Ya. Salii
 pp. 641-643
       
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Charge Carrier Mobility in n-CdxHg1  xTe Crystals Subjected to Dynamic Ultrasonic Stressing
A. I. Vlasenko, Ya. M. Olikh, and R. K. Savkina
 pp. 644-649
       
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On the Origin of the ThermalField Asymmetry in Ionic Polarization/Depolarization of Oxide in Si-MOS Structures
E. I. Gol'dman, A. G. Zhdan, and G. V. Chucheva
 pp. 650-654
       
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Equilibrium Energy Distribution of Localized Carriers in Disordered Semiconductors Subjected to an External Electric Field at Low Temperature
D. V. Nikolaenkov, V. I. Arkhipov, and V. R. Nikitenko
 pp. 655-657
       
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Photoelectric Phenomena in a-Si:H/p-CuInSe2 Heterostructures
Yu. A. Nikolaev, V. Yu. Rud', Yu. V. Rud', and E. I. Terukov
 pp. 658-661
       
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SEMICONDUCTOR STRUCTURES, INTERFACES, AND SURFACES
Thermoelectric and Photoelectric Properties of the pn CuInSe2/CdS Heterostructures Obtained by the Quasi-Equilibrium Deposition Method
M.-R. A. Magomedov, Sh. M. Ismailov, Dzh. Kh. Magomedova, and P. P. Khokhlachev
 pp. 662-664
       
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Critical Voltage Growth Rate when Initiating the Ultrafast Impact Ionization Front in a Diode Structure
A. M. Minarskii and P. B. Rodin
 pp. 665-667
       
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Special Features of GenerationRecombination Processes in the pn Junctions Based on HgMnTe
L. A. Kosyachenko, S. É. Ostapov, and Sun Weiguo
 pp. 668-670
       
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Influence of SiO2 Protective Films on the Diffusion of Atomic Hydrogen during the Hydrogenation of Epitaxial n-GaAs
A. V. Panin and N. A. Torkhov
 pp. 671-676
       
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Photosensitivity of a-Si:H/n-InSe Heterocontacts
Yu. A. Nikolaev, V. Yu. Rud', Yu. V. Rud', and E. I. Terukov
 pp. 677-679
       
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Surface Magnetoplasma Waves in a Ferromagnetic Semiconductor and their Excitation by a Magnetic Dipole
V. L. Fal'ko, S. I. Khankina, and V. M. Yakovenko
 pp. 680-685
       
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LOW-DIMENSIONAL SYSTEMS
Reflection Coefficient of a Semiconductor Superlattice Subjected to a Magnetic Field
A. A. Bulgakov and O. V. Shramkova
 pp. 686-692
       
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Low-Temperature Photoluminescence and X-ray Diffractometry Study of InxGa1  xAs Quantum Wells
S. V. Evstigneev, R. M. Imamov, A. A. Lomov, Yu. G. Sadof'ev, Yu. V. Khabarov, M. A. Chuev, and D. S. Shipitsin
 pp. 693-699
       
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Self-Ordered Microcavities Embedded in Ultrashallow Silicon pn Junctions
N. T. Bagraev, A. D. Buravlev, L. E. Klyachkin, A. M. Malyarenko, and S. A. Rykov
 pp. 700-711
       
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Ballistic Conductance of a Quantum Wire at Finite Temperatures
N. T. Bagraev, V. K. Ivanov, L. E. Klyachkin, A. M. Malyarenko, and I. A. Shelykh
 pp. 712-716
       
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AMORPHOUS, VITREOUS, AND POROUS SEMICONDUCTORS
Kinetics of Light-Induced Degradation in a-Si:H Films Investigated by Computer Simulation
M. N. Meytin, M. Zeman, B. G. Budaguan, and J. W. Metselaar
 pp. 717-722
       
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The StaeblerWronski Effect and Temperature Dependences of Photoconductivity in p-type a-Si:H
S. V. Kuznetsov
 pp. 723-727
       
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Modification of Optoelectronic Properties of Porous Silicon Produced in an Electrolyte Based on Heavy Water
B. V. Kamenev, E. A. Konstantinova, P. K. Kashkarov, and V. Yu. Timoshenko
 pp. 728-731
       
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Optical and Electrical Properties of Porous Gallium Arsenide
N. S. Averkiev, L. P. Kazakova, É. A. Lebedev, Yu. V. Rud', A. N. Smirnov, and N. N. Smirnova
 pp. 732-736
       
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Effect of Nanocrystalline Inclusions on the Photosensitivity of Amorphous Hydrogenated Silicon Films
O. A. Golikova and M. M. Kazanin
 pp. 737-740
       
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