Semiconductors -- April 2001
Volume 35, Issue 4,
pp. 371-489
ATOMIC STRUCTURE AND NONELECTRONIC PROPERTIES OF SEMICONDUCTORS
The Effect of Various Types of Shallow Impurities and Their Concentration on Microhardness and Photomechanical Properties of Semiconductors
A. B. Gerasimov and G. D. Chiradze
pp. 371-373
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Laser Beam Epitaxy of HgCdTe/Si Heterostructures
S. V. Plyatsko and N. N. Bergush
pp. 374-376
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ELECTRONIC AND OPTICAL PROPERTIES OF SEMICONDUCTORS
Emission from Hot Charge Carriers during the Formation of High-Field Autosolitons in ElectronHole Plasma in n-Ge
M. N. Vinoslavskii and A. V. Kravchenko
pp. 377-383
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An Analysis of the Shape of a Luminescence Band Induced by Transitions of Free Electrons to Carbon Atoms in Semi-Insulating Undoped GaAs Crystals
K. D. Glinchuk, N. M. Litovchenko, A. V. Prokhorovich, and O. N. Stril'chuk
pp. 384-390
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Relaxation Features of the Dielectric Response of Cd1 xZnxTe Crystals Grown from the Melt
I. A. Klimenko, V. K. Komar', V. P. Migal', and D. P. Nalivaiko
pp. 391-393
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Semiempirical Model of Carrier Mobility in Silicon Carbide for Analyzing Its Dependence on Temperature and Doping Level
T. T. Mnatsakanov, L. I. Pomortseva, and S. N. Yurkov
pp. 394-397
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Dipole Moments of Ligands and Stark Splitting of Levels of Rare-Earth Ions
M. M. Chumachkova and A. B. Roitsin[dagger]
pp. 398-404
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Mechanisms of Incorporation of an Antimony Impurity into Cadmium Telluride Crystals
E. S. Nikonyuk, Z. I. Zakharuk, V. L. Shlyakhovyi, P. M. Fochuk, and A. I. Rarenko
pp. 405-408
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A Study of the Electrical and Optical Properties of Si Delta-Doped GaAs Layers Grown by MBE on a (111)A GaAs Surface Misoriented toward the [21-bar 1-bar ] Direction
G. B. Galiev, V. G. Mokerov, É. R. Lyapin, V. V. Saraikin, and Yu. V. Khabarov
pp. 409-414
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SEMICONDUCTOR STRUCTURES, INTERFACES, AND SURFACES
The Use of the Amphoteric Nature of Impurity Silicon Atoms for Obtaining Planar pn Junctions on GaAs (111)A Substrates by Molecular Beam Epitaxy
G. B. Galiev, V. É. Kaminskii, V. G. Mokerov, and L. É. Velikhovskii
pp. 415-418
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Structural, Luminescent, and Transport Properties of Hybrid AlAsSb/InAs/Cd(Mg)Se Heterostructures Grown by Molecular Beam Epitaxy
V. A. Solov'ev, I. V. Sedova, A. A. Toropov, Ya. V. Terent'ev, S. V. Sorokin, B. Ya. Mel'tser, S. V. Ivanov, and P. S. Kop'ev
pp. 419-423
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Interface States and CapacitanceVoltage Characteristics of n-SnO2:Ni/p-Si Heterostructures under Gas-Adsorption Conditions
R. B. Vasil'ev, A. M. Gas'kov, M. N. Rumyantseva, L. I. Ryabova, and B. A. Akimov
pp. 424-426
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The Transition Layer in TiB2GaAs and AuTiB2GaAs Schottky Contacts
E. F. Venger, R. V. Konakova, O. B. Okhrimenko, S. Yu. Sapko, L. V. Shekhovtsov, and V. N. Ivanov
pp. 427-432
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Hot-Hole Lateral Transport in a Two-Dimensional GaAs/Al0.3Ga0.7As Structure
Yu. L. Ivanov, I. V. Elizarov, V. M. Ustinov, and A. E. Zhukov
pp. 433-435
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LOW-DIMENSIONAL SYSTEMS
Conductance of Quasi-Two-Dimensional Semiconductor Systems with Electrostatic Disorder in the Region of the Percolation MetalInsulator Transition
B. A. Aronzon, D. A. Bakaushin, A. S. Vedeneev, A. B. Davydov, E. Z. Meilikhov, and N. K. Chumakov
pp. 436-443
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Plasma Oscillations in Two-Dimensional Semiconductor Superstructures in the Presence of a High Electric Field
S. Yu. Glazov and S. V. Kryuchkov
pp. 444-446
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Magnetic-Field-Induced Transitions between Minibands in GaAs/AlxGa1 xAs Superlattices
V. F. Sapega, D. N. Mirlin, T. Ruf, M. Cardona, W. Winter, and K. Eberl
pp. 447-450
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PHYSICS OF SEMICONDUCTORS DEVICES
The Effect of Pulsed Laser Annealing on the Parameters of CdxHg1 xTe Photoresistors
V. N. Ryzhkov, M. I. Ibragimova, and N. S. Baryshev
pp. 451-452
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Photodiodes for a 1.54.8 µm Spectral Range Based on Type-II GaSb/InGaAsSb Heterostructures
N. D. Stoyanov, M. P. Mikhailova, O. V. Andreichuk, K. D. Moiseev, I. A. Andreev, M. A. Afrailov, and Yu. P. Yakovlev
pp. 453-458
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Photoelectric Characteristics of Infrared Photodetectors with Blocked Hopping Conduction
D. G. Esaev and S. P. Sinitsa
pp. 459-463
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Suppression of Current by Light in p-Sin+-ZnOn-ZnOPd Diode Structures
S. V. Slobodchikov, Kh. M. Salikhov, E. V. Russu, and Yu. G. Malinin
pp. 464-467
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A Study of Deep Traps at the SiO2/6H-SiC Interface Relying upon the Nonequilibrium Field Effect
P. A. Ivanov, T. P. Samsonova, V. N. Panteleev, and D. Yu. Polyakov
pp. 468-473
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Consideration of the "Island" Background Charge in Single-Electron Transistor Simulation
I. I. Abramov and E. G. Novik
pp. 474-476
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The Effect of Dislocations Formed during Growth on the Structure and Photoluminescence of innn+-GaAs Epilayers and on the Related Microwave Transistors Parameters
M. P. Lisitsa, F. V. Motsnyi, V. F. Motsnyi, and I. V. Prokopenko
pp. 477-480
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Radiation Hardness of SiC Ion Detectors under Relativistic Protons
A. M. Ivanov, N. B. Strokan, D. V. Davydov, N. S. Savkina, A. A. Lebedev, Yu. T. Mironov, G. A. Ryabov, and E. M. Ivanov
pp. 481-484
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The Thermal Cross-Interference Effects in the Arrays of Vertical-Cavity Surface-Emitting Lasers
S. M. Zakharov
pp. 485-489
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