Semiconductors -- July 2001
Volume 35, Issue 7,
pp. 735-859
REVIEWS
Doping of Semiconductors Using Radiation Defects Produced by Irradiation with Protons and Alpha Particles
V. A. Kozlov and V. V. Kozlovski
pp. 735-761
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ATOMIC STRUCTURE AND NONELECTRONIC PROPERTIES OF SEMICONDUCTORS
The Microstructure and Physical Properties of Thin SnO2 Films
S. I. Rembeza, T. V. Svistova, E. S. Rembeza, and O. I. Borsyakova
pp. 762-765
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ELECTRONIC AND OPTICAL PROPERTIES OF SEMICONDUCTORS
The Accuracy of Reconstructing the Semiconductor Doping Profile from CapacitanceVoltage Characteristics Measured during Electrochemical Etching
I. R. Karetnikova, I. M. Nefedov, and V. I. Shashkin
pp. 766-772
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Optical Properties of Cd1 xZnxTe (0 < x < 0.1) Single Crystals in the Infrared Spectral Region
A. I. Belogorokhov, V. M. Lakeenkov[dagger], and L. I. Belogorokhova
pp. 773-776
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Metallic Conductivity over an Acceptor Band of Lightly Compensated Copper-Doped p-Hg0.78Cd0.22Te Crystals
V. V. Bogoboyashchii
pp. 777-783
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Fermi Level Pinning and Electrical Properties of Irradiated CdxHg1 xTe Alloys
V. N. Brudnyi and S. N. Grinyaev
pp. 784-787
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SEMICONDUCTOR STRUCTURES, INTERFACES, AND SURFACES
Effect of Ballistic Electron Transport in Metaln-GaAsn+-GaAs Schottky-Barrier Structures
N. A. Torkhov
pp. 788-795
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Calculation of the Variation in the Work Function Caused by Adsorption of Metal Atoms on Semiconductors
S. Yu. Davydov and A. V. Pavlyk
pp. 796-799
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Charge Transport in HgCdTe-based n+p Photodiodes
J. V. Gumenjuk-Sichevskaja, F. F. Sizov, V. N. Ovsyuk, V. V. Vasil'ev, and D. G. Esaev
pp. 800-806
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LOW-DIMENSIONAL SYSTEMS
Electronic State Mixing in Xx and Xy Valleys in AlAs/GaAs (001)
G. F. Karavaev and V. N. Chernyshov
pp. 807-815
Full Text: PDF (110 kB)
AMORPHOUS, VITREOUS, AND POROUS SEMICONDUCTORS
Adsorption-based Porosimetry Using Capacitance Measurements
E. A. Tutov, A. Yu. Andryukov, and E. N. Bormontov
pp. 816-820
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Structural Transformations and Silicon Nanocrystallite Formation in SiOx Films
V. Ya. Bratus', V. A. Yukhimchuk, L. I. Berezhinsky, M. Ya. Valakh, I. P. Vorona, I. Z. Indutnyi, T. T. Petrenko, P. E. Shepeliavyi, and I. B. Yanchuk
pp. 821-826
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PHYSICS OF SEMICONDUCTOR DEVICES
Luminescence Spectra and Efficiency of GaN-based Quantum-Well Heterostructure Light Emitting Diodes: Current and Voltage Dependence
V. E. Kudryashov, S. S. Mamakin, A. N. Turkin, A. É. Yunovich, A. N. Kovalev, and F. I. Manyakhin
pp. 827-834
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Interaction of Metal Nanoparticles with a Semiconductor in Surface-Doped Gas Sensors
S. V. Ryabtsev, E. A. Tutov, E. N. Bormontov, A. V. Shaposhnik, and A. V. Ivanov
pp. 835-839
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Cross-Sectional Electrostatic Force Microscopy of Semiconductor Laser Diodes
A. V. Ankudinov, E. Yu. Kotel'nikov, A. A. Kantsel'son, V. P. Evtikhiev, and A. N. Titkov
pp. 840-846
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Comparative Analysis of Long-Wavelength (1.3 µm) VCSELs on GaAs Substrates
N. A. Maleev, A. Yu. Egorov, A. E. Zhukov, A. R. Kovsh, A. P. Vasil'ev, V. M. Ustinov, N. N. Ledentsov, and Zh. I. Alferov
pp. 847-853
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1.3 µm Vertical Microcavities with InAs/InGaAs Quantum Dots and Devices Based on Them
A. V. Sakharov, I. L. Krestnikov, N. A. Maleev, A. R. Kovsh, A. E. Zhukov, A. F. Tsatsul'nikov, V. M. Ustinov, N. N. Ledentsov, D. Bimberg, J. A. Lott, and Zh. I. Alferov
pp. 854-859
Full Text: PDF (97 kB)