Semiconductors -- August 2001
Volume 35, Issue 8,
pp. 861-979
ATOMIC STRUCTURE AND NONELECTRONIC PROPERTIES OF SEMICONDUCTORS
Growth of Fractal Lithium Clusters in Germanium
S. V. Bulyarskii, V. V. Svetukhin, O. V. Agafonova, A. G. Grishin, and P. A. Il'in
pp. 861-863
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Vibration Modes of Oxygen Dimers in Germanium
V. V. Litvinov, L. I. Murin, L. Lindström, V. P. Markevich, and A. A. Klechko
pp. 864-869
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ELECTRONIC AND OPTICAL PROPERTIES OF SEMICONDUCTORS
Effect of Deviations from Stoichiometry on Electrical Conductivity and Photoconductivity of CuInSe2 Crystals
M. A. Abdullaev, Dz. Kh. Magomedova, R. M. Gadzhieva, E. I. Terukov, Yu. A. Nikolaev, Yu. V. Rud', and P. P. Khokhlachev
pp. 870-872
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The Onset of Double Limiting Cycle in the Impurity-Assisted Electric Breakdown of a Compensated Semiconductor with a Shorted Hall Voltage
K. M. Jandieri and Z. S. Kachlishvili
pp. 873-876
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Preparation and Properties of Isotopically Pure Polycrystalline Silicon
O. N. Godisov, A. K. Kaliteevskii, V. I. Korolev, B. Ya. Ber, V. Yu. Davydov, M. A. Kaliteevskii, and P. S. Kop'ev
pp. 877-879
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Electrical Properties of CdxHg1 xTe/CdZnTe Heterostructures
A. G. Belov, A. I. Belogorokhov, and V. M. Lakeenkov
pp. 880-882
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Native and Impurity Defects in ZnSe:In Single Crystals Prepared by Free Growth
Yu. F. Vaksman, Yu. A. Nitsuk, Yu. N. Purtov, and P. V. Shapkin
pp. 883-889
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Origin of an Absorption Band Peaked at 5560 cm1 and Related to Divacancies in Si1 xGex
Yu. V. Pomozov, M. G. Sosnin, L. I. Khirunenko, N. V. Abrosimov, and W. Schröder
pp. 890-894
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Photoluminescence Kinetics in GaAs under the Influence of Surface Acoustic Waves
K. S. Zhuravlev, A. M. Gilinskii, A. V. Tsarev, and A. E. Nikolaenko
pp. 895-899
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Optical Band Gap of Cd1 xMnxTe and Zn1 xMnxTe Semiconductors
P. V. Zhukovskii, Ya. Partyka, P. Vengerek, Yu. V. Sidorenko, Yu. A. Shostak, and A. Rodzik
pp. 900-903
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The Role of Lead in Growing Ga1 XInXAsYSb1 Y Solid Solutions by Liquid-Phase Epitaxy
T. I. Voronina, T. S. Lagunova, E. V. Kunitsyna, Ya. A. Parkhomenko, D. A. Vasyukov, and Yu. P. Yakovlev
pp. 904-911
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SEMICONDUCTOR STRUCTURES, INTERFACES, AND SURFACES
Interface States and Deep-Level Centers in Silicon-on-Insulator Structures
I. V. Antonova, J. Stano, D. V. Nikolaev, O. V. Naumova, V. P. Popov, and V. A. Skuratov
pp. 912-917
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Simultaneous Doping of Silicon Layers with Erbium and Oxygen in the Course of Molecular-Beam Epitaxy
V. G. Shengurov, S. P. Svetlov, V. Yu. Chalkov, G. A. Maksimov, Z. F. Krasil'nik, B. A. Andreev, M. V. Stepikhova, D. V. Shengurov, L. Palmetshofer, and H. Ellmer
pp. 918-923
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Pulsed Laser-Stimulated Surface Acoustic Waves in p-CdTe Crystals
A. Baidullaeva, A. I. Vlasenko, É. I. Kuznetsov, A. V. Lomovtsev, P. E. Mozol', and A. B. Smirnov
pp. 924-926
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Analysis of Inherent Potential Nonuniformities at the Extrinsic-Semiconductor Surface
V. B. Bondarenko, M. V. Kuz'min, and V. V. Korablev
pp. 927-931
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LOW-DIMENSIONAL SYSTEMS
Anisotropy of the Spatial Distribution of In(Ga)As Quantum Dots in In(Ga)AsGaAs Multilayer Heterostructures Studied by X-ray and Synchrotron Diffraction and Transmission Electron Microscopy
N. N. Faleev, Yu. G. Musikhin, A. A. Suvorova, A. Yu. Egorov, A. E. Zhukov, A. R. Kovsh, V. M. Ustinov, M. Tabuchi, and Y. Takeda
pp. 932-940
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Optical Properties of Germanium Monolayers on Silicon
T. M. Burbaev, T. N. Zavaritskaya, V. A. Kurbatov, N. N. Mel'nik, V. A. Tsvetkov, K. S. Zhuravlev, V. A. Markov, and A. I. Nikiforov
pp. 941-946
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AMORPHOUS, VITREOUS, AND POROUS SEMICONDUCTORS
The Effect of External Factors on Photoelectric Parameters of Amorphous Hydrogenated Silicon in Relation to the Initial Characteristics of the Films
N. Rakhimov, U. Babakhodzhaev, Kh. Mavlyanov, and R. Ikramov
pp. 947-948
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Anomalous Polarization of Raman Scattering by Transverse and Longitudinal Phonons in Porous Doped GaAs
V. N. Denisov, B. N. Mavrin, and V. A. Karavanskii
pp. 949-952
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Effect of Temperature on Photoconductivity and Its Decay in Microcrystalline Silicon
A. G. Kazanskii, H. Mell, E. I. Terukov, and P. A. Forsh
pp. 953-955
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X-ray Spectroscopic Study of Electronic Structure of Amorphous Silicon and Silicyne
A. I. Mashin, A. F. Khokhlov, É. P. Domashevskaya, V. A. Terekhov, and N. I. Mashin
pp. 956-961
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PHYSICS OF SEMICONDUCTOR DEVICES
Threshold Characteristics of lambda = 1.55 µm InGaAsP/InP Heterolasers
G. G. Zegrya, N. A. Pikhtin, G. V. Skrynnikov, S. O. Slipchenko, and I. S. Tarasov
pp. 962-969
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An Ionization-Type Si:S-Based Semiconductor Converter of Infrared Images with Sensitivity in the Spectral Range of CO2-Laser Radiation
V. T. Tulanov, Kh. B. Siyabekov, A. Sh. Davletova, and K. A. Ortaeva
pp. 970-973
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A Study of Technological Processes in the Production of High-Power High-Voltage Bipolar Transistors Incorporating an Array of Inclusions in the Collector Region
N. I. Volokobinskaya, I. N. Komarov, T. V. Matyukhina, V. I. Reshetnikov, A. A. Rush, I. V. Falina, and A. S. Yastrebov
pp. 974-978
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ERRATA
Erratum: "Carrier Photoexcitation from Levels in Quantum Dots to States of the Continuum in Lasing" [Semiconductors 35 (3), 343 (2001)]
L. V. Asryan and R. A. Suris
p. 979
Full Text: PDF (6 kB)