Semiconductors -- April 2002
Volume 36, Issue 4,
pp. 363-479
ATOMIC STRUCTURE AND NONELECTRONIC PROPERTIES OF SEMICONDUCTORS
Changes in the State of Phosphorus Atoms in the Silicon Lattice as a Result of Interaction with Radiation Defects
V. V. Bolotov, G. N. Kamaev, and L. S. Smirnov
pp. 363-366
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Ultrasonically Stimulated Low-Temperature Redistribution of Impurities in Silicon
I. V. Ostrovskii, A. B. Nadtochii, and A. A. Podolyan
pp. 367-369
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Simulation of Low-Temperature Arsenic Diffusion from a Heavily Doped Silicon Layer
O. V. Aleksandrov
pp. 370-374
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ELECTRONIC AND OPTICAL PROPERTIES OF SEMICONDUCTORS
Generalized Character of the Dielectric Response of CdTe Crystals Grown from the Melt
I. A. Klimenko and V. P. Migal'
pp. 375-378
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Effect of the Radial Electric Field on Absorption in a Quantized Spherical Layer
V. A. Arutyunyan
pp. 379-381
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Photoelectric CV Profiling of Majority Charge Carriers and Effective Lifetimes of Minority Charge Carriers in Gettered GaAs Wafers
V. F. Andrievskii, A. T. Gorelenok, N. A. Zagorel'skaya, A. V. Kamanin, and N. M. Shmidt
pp. 382-384
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Effective Electron Mass in Heavily Doped GaAs in the Ordering of Impurity Complexes
V. A. Bogdanova, N. A. Davletkil'deev, N. A. Semikolenova, and E. N. Sidorov
pp. 385-389
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Determination of the Matrix Element of the Quasi-Momentum Operator in the Zero-Gap Semiconductor HgSe by the Field-Effect Method in Electrolyte
O. Yu. Shevchenko, V. F. Radantsev, A. M. Yafyasov, V. B. Bozhevolnov, I. M. Ivankiv, and A. D. Perepelkin
pp. 390-393
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Energy Transfer of Ce3+ --> Eu2+ in the CaGa2S4 Compound
R. B. Dzhabbarov
pp. 394-397
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Features of Optical Properties of AlxGa1 xN Solid Solutions
V. G. Deibuk, A. V. Voznyi, and M. M. Sletov
pp. 398-403
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Increase in Quantum Efficiency of IR Emission in Elastically Strained Narrow-Gap Semiconductors
S. G. Gasan-zade, M. V. Strikha, S. V. Staryi, G. A. Shepel'skii, and V. A. Boiko
pp. 404-409
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Analysis and Refinement of Mathematical Tools for Modified Time-of-Flight Method
S. P. Vikhrov, N. V. Vishnyakov, A. A. Maslov, and V. G. Mishustin
pp. 410-413
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SEMICONDUCTOR STRUCTURES, INTERFACES, AND SURFACES
Causes of Variation in the Static CurrentVoltage Characteristics of the Structures with the Me/nn+-GaAs Schottky Barrier on Hydrogenation
N. A. Torkhov
pp. 414-419
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Field Effect in a System Consisting of Electrolyte and (TlBiSe2)1 x(TlBiS2)x Solid Solution
O. Yu. Shevchenko, A. M. Yafyasov, V. B. Bozhevol'nov, I. M. Ivankiv, and A. D. Perepelkin
pp. 420-423
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Effect of Surface on the Excitonic Characteristics of Semiconductors
V. G. Litovchenko, N. L. Dmitruk, D. V. Korbutyak, and A. V. Sarikov
pp. 424-429
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Nature of the Edge Electroluminescence Peak in the Si:(Er,O) Diode Breakdown Mode
A. M. Emel'yanov, Yu. A. Nikolaev, and N. A. Sobolev
pp. 430-433
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LOW-DIMENSIONAL SYSTEMS
Control of the Interband and Intersubband Transition Energy in Quantum Wells Using Localized Isoelectronic Perturbations
K. Durinyan, A. Zatikyan, and S. Petrosyan
pp. 434-438
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Quantized Conductance in Silicon Quantum Wires
N. T. Bagraev, A. D. Buravlev, L. E. Klyachkin, A. M. Malyarenko, W. Gehlhoff, V. K. Ivanov, and I. A. Shelykh
pp. 439-460
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Exciton Recombination in delta-Doped Type-II GaAs/AlAs Superlattices
K. S. Zhuravlev, A. K. Sulaimanov, A. M. Gilinskii, L. S. Braginskii, A. I. Toropov, and A. K. Bakarov
pp. 461-465
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AMORPHOUS, VITREOUS, AND POROUS SEMICONDUCTORS
The Effect of Adsorption on the Electrical Properties of Structures Based on Oxidized Porous Silicon
D. I. Bilenko, O. Ya. Belobrovaya, É. A. Zharkova, I. B. Mysenko, and E. I. Khasina
pp. 466-471
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PHYSICS OF SEMICONDUCTOR DEVICES
Special Features of Electron Drift in Submicrometer GaAs Structures
V. A. Gergel', E. Yu. Kul'kova, V. G. Mokerov, M. V. Timofeev, and G. Yu. Khrenov
pp. 472-475
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Long-Term Variation of Electrical and Photoelectric Characteristics of Pdp-InP Diode Structures
S. V. Slobodchikov, Kh. M. Salikhov, and E. V. Russu
pp. 476-479
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