Semiconductors -- April 2003
Volume 37, Issue 4,
pp. 367-492
ATOMIC STRUCTURE AND NONELECTRONIC PROPERTIES OF SEMICONDUCTORS
Structural Disordering and ViedemannFranz Relation in Melts of Some IIIVV2 Semiconductors
Ya. B. Magomedov and M. A. Aidamirov
pp. 367-369
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ELECTRONIC AND OPTICAL PROPERTIES OF SEMICONDUCTORS
Effect of Crystallization of Amorphous Vanadium Dioxide Films on the Parameters of a SemiconductorMetal Phase Transition
V. A. Klimov, I. O. Timofeeva, S. D. Khanin, E. B. Shadrin, A. V. Il'inskii, and F. Silva-Andrade
pp. 370-374
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Recombination Current Instability in Epitaxial p+n Structures with Impurity Atoms Locally Incorporated into the n-type Region and Determination of the Deep Center Parameters
B. S. Muravskii[dagger], O. N. Kulikov, and V. N. Chernyi
pp. 375-379
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Optical Reflection in (Pb0.78Sn0.22)1 xInxTe Solid Solutions with a High Indium Content
A. N. Veis and A. V. Nashchekin
pp. 380-383
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Effect of Lattice Deformation on Semiconducting Properties of CrSi2
A. V. Krivosheeva, V. L. Shaposhnikov, A. E. Krivosheev, A. B. Filonov, and V. E. Borisenko
pp. 384-389
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Electrical Properties of InAs Irradiated with Protons
V. N. Brudnyi, N. G. Kolin, and A. I. Potapov
pp. 390-395
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Influence of Pulsed Laser Radiation on the Morphology and Photoelectric Properties of InSb Crystals
V. A. Gnatyuk and O. S. Gorodnychenko
pp. 396-398
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IR Birefringence in Artificial Crystal Fabricated by Anisotropic Etching of Silicon
E. V. Astrova, T. S. Perova, V. A. Tolmachev, A. D. Remenyuk, J. Vij, and A. Moore
pp. 399-403
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Energy Levels of Vacancies and Interstitial Atoms in the Band Gap of Silicon
V. V. Lukjanitsa
pp. 404-413
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SEMICONDUCTOR STRUCTURES, INTERFACES, AND SURFACES
Photosensitive Structures Based on ZnIn2Se4 Single Crystals
A. A. Vaipolin, Yu. A. Nikolaev, V. Yu. Rud', Yu. V. Rud', and E. I. Terukov
pp. 414-416
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Special Features of Electron Scattering at AlxGa1 xAs/AlAs(001) Interfaces
S. N. Grinyaev, G. F. Karavaev, and V. N. Chernyshov
pp. 417-425
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The Charge Accumulation in an Insulator and the States at Interfaces of Silicon-on-Insulator Structures as a Result of Irradiation with Electrons and Gamma-Ray Photons
D. V. Nikolaev, I. V. Antonova, O. V. Naumova, V. P. Popov, and S. A. Smagulova
pp. 426-432
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The Effect of Internal Fields on Tunneling Current in Strained GaN/AlxGa1 xN(0001) Structures
S. N. Grinyaev and A. N. Razzhuvalov
pp. 433-438
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Characteristics of Gallium Arsenide Structures and Gunn Devices Based on Them Fabricated Using the RadiationThermal Technology
M. V. Ardyshev and V. M. Ardyshev
pp. 439-442
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The Influence of Carbon on the Properties of Si/SiGe Heterostructures
M. Ya. Valakh, V. N. Dzhagan, L. A. Matveeva, A. S. Oberemok, B. N. Romanyuk, and V. A. Yukhimchuk
pp. 443-447
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Effect of Irradiation with Low-Energy Ar Ions on the Characteristics of the Working and Rear Sides of Single-Crystal GaAs Substrate
A. S. Alalykin, P. N. Krylov, I. V. Fedotova, and A. B. Fedotov
pp. 448-451
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GenerationRecombination Centers in CdTe:V
L. A. Kosyachenko, S. Yu. Paranchich, Yu. V. Tanasyuk, V. M. Sklyarchuk, E. F. Sklyarchuk, E. L. Maslyanchuk, and V. V. Motushchuk
pp. 452-455
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Special Features of Formation and Characteristics of Ni/21R-SiC Schottky Diodes
V. L. Litvinov, K. D. Demakov, O. A. Ageev, A. M. Svetlichny, R. V. Konakova, P. M. Lytvyn, O. S. Lytvyn, and V. V. Milenin
pp. 456-461
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LOW-DIMENSIONAL SYSTEMS
Properties of Ge Nanocrystals Formed by Implantation of Ge+ Ions into SiO2 Films with Subsequent Annealing under Hydrostatic Pressure
I. E. Tyschenko, A. B. Talochkin, A. G. Cherkov, K. S. Zhuravlev, A. Misiuk, M. Voelskow, and W. Skorupa
pp. 462-467
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AMORPHOUS, VITREOUS, AND POROUS SEMICONDUCTORS
Laser Ultrasonic Study of Porous Silicon Layers
S. M. Zharkii, A. A. Karabutov, I. M. Pelivanov, N. B. Podymova, and V. Yu. Timoshenko
pp. 468-472
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Raman Spectroscopy of Amorphous Carbon Modified with Iron
S. G. Yastrebov, V. I. Ivanov-Omskii, F. Dumitrache, and C. Morosanu
pp. 473-476
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Electrolytic Fabrication of Porous Silicon with the Use of Internal Current Source
D. N. Goryachev, L. V. Belyakov, and O. M. Sreseli
pp. 477-481
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PHYSICS OF SEMICONDUCTOR DEVICES
3C-SiC pn Structures Grown by Sublimation on 6H-SiC Substrates
A. A. Lebedev, A. M. Strel'chuk, D. V. Davydov, N. S. Savkina, A. S. Tregubova, A. N. Kuznetsov, V. A. Solov'ev, and N. K. Poletaev
pp. 482-484
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Current and Temperature Tuning of Quantum-Well Lasers Operating in 2.0- to 2.4-µm Range
A. P. Astakhova, A. N. Baranov, A. Viset, A. N. Imenkov, N. M. Kolchanova, N. D. Stoyanov, A. Chernyaev, D. A. Yarekha, and Yu. P. Yakovlev
pp. 485-490
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PERSONALIA
Vladimir Ivanovich Ivanov-Omskii (dedicated to his 70th birthday)
pp. 491-492
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