Characterization of Structural Defects in Wide Band-Gap Compound Materials for Semiconductor and Opto-Electronic Applications

View/Open

GOUE_grad.sunysb_0771E_12877.pdf (6.184Mb)

Author

GOUE, Ouloide Yannick

Metadata

Show full item record

Preview in Universal Viewer

URI

http://hdl.handle.net/11401/76137

Collections

• Stony Brook Theses and Dissertations Collection [4009]