Defect Analysis of Boron Phosphide Thin Films and Sapphire Single Crystal Using Synchrotron X-ray Topography

View/Open

Ding_grad.sunysb_0771M_11899.pdf (7.847Mb)

Author

Ding, Zihao

Metadata

Show full item record

Preview in Universal Viewer

URI

http://hdl.handle.net/11401/76296

Collections

• Stony Brook Theses and Dissertations Collection [4009]