| dc.contributor.other | Preservation Department, Stony Brook University Libraries. | en_US |
| dc.contributor.other | Cataloging & Metadata Department, Stony Brook University Libraries. | en_US |
| dc.identifier.uri | http://hdl.handle.net/1951/37113 | |
| dc.identifier.uri | http://hdl.handle.net/11401/65315 | |
| dc.format | Monograph. | en_US |
| dc.format.extent | 2635526 bytes | |
| dc.format.medium | Electronic Resource. | en_US |
| dc.language.iso | en_US | |
| dc.rights | All Rights Reserved. Stony Brook University. | en_US |
| dc.type | Technical Report | en_US |
| dcterms.creator | Stell, George | en_US |
| dcterms.dateAccepted | 2007-07-17T16:50:16Z | |
| dcterms.dateAccepted | 2015-04-24T14:26:47Z | |
| dcterms.dateSubmitted | 2007-07-17T16:50:16Z | |
| dcterms.dateSubmitted | 2015-04-24T14:26:47Z | |
| dcterms.extent | leave(s) : ill; 28 cm. | en_US |
| dcterms.format | application/pdf | |
| dcterms.issued | 1969 | en_US |
| dcterms.provenance | Made available in DSpace on 2007-07-17T16:50:16Z (GMT). No. of bitstreams: 1
CEAS--144.pdf: 2635526 bytes, checksum: d5020a5dfccd8b833c52e64342fe1c4f (MD5)
Previous issue date: 1969 | en |
| dcterms.provenance | Made available in DSpace on 2015-04-24T14:26:47Z (GMT). No. of bitstreams: 3
CEAS--144.pdf.jpg: 1237 bytes, checksum: 10219e8219fcd754e7301bae652a16c7 (MD5)
CEAS--144.pdf.txt: 11038 bytes, checksum: 70abb25f2ab65dcc2df9a64e6bab32a8 (MD5)
CEAS--144.pdf: 2635526 bytes, checksum: d5020a5dfccd8b833c52e64342fe1c4f (MD5)
Previous issue date: 1969 | en |
| dcterms.publisher | Stony Brook, NY. | en_US |
| dcterms.publisher | Stony Brook, N.Y.: State University of New York at Stony Brook, College of Engineering. | en_US |
| dcterms.publisher | Stony Brook University. | en_US |
| dcterms.title | A weak-scaling relation among critical exponents | en_US |
| dc.description.contributor | The content contained herein is maintained and curated by the Preservation Department. | en_US |
| dc.description.contributor | This record is revised and maintained by the content administrators from the Cataloging & Metadata Department. | en_US |
