dc.contributor.other | Preservation Department, Stony Brook University Libraries. | en_US |
dc.contributor.other | Cataloging & Metadata Department, Stony Brook University Libraries. | en_US |
dc.identifier.uri | http://hdl.handle.net/1951/37163 | |
dc.identifier.uri | http://hdl.handle.net/11401/65346 | |
dc.format | Monograph. | en_US |
dc.format.extent | 1516734 bytes | |
dc.format.medium | Electronic Resource. | en_US |
dc.language.iso | en_US | |
dc.rights | All Rights Reserved. Stony Brook University. | en_US |
dc.type | Technical Report | en_US |
dcterms.creator | Stell, George | en_US |
dcterms.dateAccepted | 2007-07-17T16:50:24Z | |
dcterms.dateAccepted | 2015-04-24T14:26:53Z | |
dcterms.dateSubmitted | 2007-07-17T16:50:24Z | |
dcterms.dateSubmitted | 2015-04-24T14:26:53Z | |
dcterms.extent | leave(s) : ill; 28 cm. | en_US |
dcterms.format | application/pdf | |
dcterms.issued | 1970 | en_US |
dcterms.provenance | Made available in DSpace on 2007-07-17T16:50:24Z (GMT). No. of bitstreams: 1
CEAS--156.pdf: 1516734 bytes, checksum: b5dcc8ed8858d22b97a65115d8a4f336 (MD5)
Previous issue date: 1970 | en |
dcterms.provenance | Made available in DSpace on 2015-04-24T14:26:53Z (GMT). No. of bitstreams: 3
CEAS--156.pdf.jpg: 1589 bytes, checksum: 21144276b91e17bfeb3504df0f49c67e (MD5)
CEAS--156.pdf.txt: 8115 bytes, checksum: 19e283353c2344105cbbc173d2c8c74c (MD5)
CEAS--156.pdf: 1516734 bytes, checksum: b5dcc8ed8858d22b97a65115d8a4f336 (MD5)
Previous issue date: 1970 | en |
dcterms.publisher | Stony Brook, NY. | en_US |
dcterms.publisher | Stony Brook, N.Y.: State University of New York at Stony Brook, College of Engineering. | en_US |
dcterms.publisher | Stony Brook University. | en_US |
dcterms.title | Some implications of weak-scaling theory | en_US |
dc.description.contributor | The content contained herein is maintained and curated by the Preservation Department. | en_US |
dc.description.contributor | This record is revised and maintained by the content administrators from the Cataloging & Metadata Department. | en_US |