dc.contributor.other | Preservation Department, Stony Brook University Libraries. | en_US |
dc.contributor.other | Cataloging & Metadata Department, Stony Brook University Libraries. | en_US |
dc.identifier.uri | http://hdl.handle.net/1951/37115 | |
dc.identifier.uri | http://hdl.handle.net/11401/65426 | |
dc.format | Monograph. | en_US |
dc.format.extent | 18368306 bytes | |
dc.format.medium | Electronic Resource. | en_US |
dc.language.iso | en_US | |
dc.rights | All Rights Reserved. Stony Brook University. | en_US |
dc.type | Technical Report | en_US |
dcterms.creator | Zemanian, A. H.(Armen H.) | en_US |
dcterms.dateAccepted | 2007-07-17T16:54:48Z | |
dcterms.dateAccepted | 2015-04-24T14:27:08Z | |
dcterms.dateSubmitted | 2007-07-17T16:54:48Z | |
dcterms.dateSubmitted | 2015-04-24T14:27:08Z | |
dcterms.extent | leave(s) : ill; 28 cm. | en_US |
dcterms.format | application/pdf | |
dcterms.issued | 1969 | en_US |
dcterms.provenance | Made available in DSpace on 2007-07-17T16:54:48Z (GMT). No. of bitstreams: 1
CEAS--142.pdf: 18368306 bytes, checksum: 50e5560d36bd79723be60adb52eb8392 (MD5)
Previous issue date: 1969 | en |
dcterms.provenance | Made available in DSpace on 2015-04-24T14:27:08Z (GMT). No. of bitstreams: 3
CEAS--142.pdf.jpg: 1622 bytes, checksum: c7d8ea9b4b0704738a3758227a47a55e (MD5)
CEAS--142.pdf.txt: 83341 bytes, checksum: f807ba8f3c024a19f0e83c928387679a (MD5)
CEAS--142.pdf: 18368306 bytes, checksum: 50e5560d36bd79723be60adb52eb8392 (MD5)
Previous issue date: 1969 | en |
dcterms.publisher | Stony Brook, NY. | en_US |
dcterms.publisher | Stony Brook, N.Y.: State University of New York at Stony Brook, College of Engineering. | en_US |
dcterms.publisher | Stony Brook University. | en_US |
dcterms.title | Banach systems, Hilbert ports, and infinite ports | en_US |
dc.description.contributor | The content contained herein is maintained and curated by the Preservation Department. | en_US |
dc.description.contributor | This record is revised and maintained by the content administrators from the Cataloging & Metadata Department. | en_US |