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dc.identifier.urihttp://hdl.handle.net/1951/51169
dc.identifier.urihttp://hdl.handle.net/11401/71733
dc.description.sponsorshipThis work is sponsored by the Stony Brook University Graduate School in compliance with the requirements for completion of degree.en_US
dc.formatMonograph
dc.format.mediumElectronic Resourceen_US
dc.language.isoen_US
dc.publisherThe Graduate School, Stony Brook University: Stony Brook, NY.
dc.typeThesis
dcterms.available2011-06-02T17:40:18Z
dcterms.available2015-04-24T14:48:55Z
dcterms.creatorZhang, Ning
dcterms.dateAccepted2011-06-02T17:40:18Z
dcterms.dateAccepted2015-04-24T14:48:55Z
dcterms.dateSubmitted2011-06-02T17:40:18Z
dcterms.dateSubmitted2015-04-24T14:48:55Z
dcterms.formatMonograph
dcterms.formatApplication/PDFen_US
dcterms.identifierhttp://hdl.handle.net/1951/51169
dcterms.identifierhttp://hdl.handle.net/11401/71733
dcterms.issued2011-06-02
dcterms.languageen_US
dcterms.provenanceSubmitted by Karen D'Angelo (kdangelo@notes.cc.sunysb.edu) on 2011-06-02T17:40:18Z No. of bitstreams: 1 000000658.sbu.pdf: 2509264 bytes, checksum: 6c99c3c03fd250c1a20849e4409c0f0e (MD5)en
dcterms.provenanceMade available in DSpace on 2011-06-02T17:40:18Z (GMT). No. of bitstreams: 1 000000658.sbu.pdf: 2509264 bytes, checksum: 6c99c3c03fd250c1a20849e4409c0f0e (MD5)en
dcterms.provenanceMade available in DSpace on 2015-04-24T14:48:55Z (GMT). No. of bitstreams: 3 000000658.sbu.pdf.jpg: 1894 bytes, checksum: a6009c46e6ec8251b348085684cba80d (MD5) 000000658.sbu.pdf: 2509264 bytes, checksum: 6c99c3c03fd250c1a20849e4409c0f0e (MD5) 000000658.sbu.pdf.txt: 93711 bytes, checksum: 7a446231e3f31504ef8ece39cdef22f4 (MD5) Previous issue date: 2011-06-02en
dcterms.publisherThe Graduate School, Stony Brook University: Stony Brook, NY.
dcterms.subjectsilicon carbide
dcterms.subjectSiC
dcterms.subjectthreading edge dislocations (TED)
dcterms.subjectthreading screw dislocations (TSD)
dcterms.subjectMicropipes (MP)
dcterms.subjectbasal plane dislocations (BPD)
dcterms.subjectlow angle grain boundaries (LAGD)
dcterms.subjectstacking faults (SF)
dcterms.titleCharacterization of Dislocations Structures and Properties in Silicon Carbide Bulk Crystals and Epilayers
dcterms.typeThesis


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