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Dudley, Michael (5)
Gersappe, Dilip (5)
Bouet, Nathalie. (3)Conley, Raymond (3)Raghothomachar, Balaji (3)Raghothamachar, Balaji (2)Hansen, Darren. (1)Noveski, Vladimir. (1)Sarkar, Vishwanath (1)Wang, Huanhuan (1)SubjectOptics -- Materials Science -- Engineering (3)Characterization, Crystallography, Defect Analysis, Semiconductor, Silicon Carbide, X-ray Topography (1)Depth profiling, Materials characterization, Residual stress, Silicon semiconductor, Single crystal, X-ray topography (1)Materials Science (1)Materials Science--Engineering (1)... View MoreDate Issued2017 (3)2011 (1)2014 (1)Has File(s)Yes (5)