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Dudley, Michael (4)
Raghothamachar, Balaji (3)Venkatesh, T. A.. (2)Ben-Zvi, Ilan (1)Byrappa, Shayan Mysore (1)Liang, Xue (1)Muller, Erik. (1)Smedley, John (1)Sokolov, Jonathan (1)Su, Dong. (1)... View MoreSubjectMaterials Science (4)characterization, defect, semiconducotr, wide bandgap, X-ray topography (1)characterization, ray tracing, stress distribution, threading dislocation (1)Multi-Alkali, Photocathode (1)... View MoreDate Issued
2013 (4)
Has File(s)Yes (4)