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Dudley, Michael (6)
Raghothamachar, Balaji (6)Venkatesh, T. (2)Chen, Ruifen (1)Ding, Zihao (1)Gaowei, Mengjia (1)Gersappe, Dilip (1)Hansen, Darren. (1)Li, Zheyu (1)Muller, Erik. (1)... View MoreSubjectMaterials Science (6)Boron Phosphide thin films, crystal quality, sapphire single crystal, SEM, Synchrotron X-ray Topography (1)Characterization, Crystallography, Defect Analysis, Semiconductor, Silicon Carbide, X-ray Topography (1)Crystal growth, Dislocation, High resolution transmission electron microscopy, Stacking fault, Synchrotron x-ray topography, Wide bandgap semiconductor (1)CVD Diamond, HAXPES, nUNCD, Responsivity, Schottky barrier, x-ray detection (1)sapphire, SWBXT, Synchrotron White Beam X-ray Topography (1)... View MoreDate Issued
2014 (6)
Has File(s)Yes (6)