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Dudley, Michael (4)
Venkatesh, T. A.. (4)
Raghothamachar, Balaji (3)Koga, Tadanori (1)RUAN, YUXUAN (1)Sun, Shun (1)Yang, Yu (1)Zhou, Tianyi (1)Subject
Materials Science (4)
characterization, defect, semiconducotr, wide bandgap, X-ray topography (1)characterization, ray tracing, stress distribution, threading dislocation (1)clay, dead layer, polystyrene, scCO2, two interfacial effect (1)dislocations, sapphire, X-ray Topography (1)... View MoreDate Issued2012 (2)2013 (2)Has File(s)Yes (4)