| dc.identifier.uri | http://hdl.handle.net/11401/76365 | |
| dc.description.sponsorship | This work is sponsored by the Stony Brook University Graduate School in compliance with the requirements for completion of degree. | en_US |
| dc.format | Monograph | |
| dc.format.medium | Electronic Resource | en_US |
| dc.language.iso | en_US | |
| dc.publisher | The Graduate School, Stony Brook University: Stony Brook, NY. | |
| dc.type | Thesis | |
| dcterms.abstract | Defects would effect the optical properties and operation performances of sapphire single crystal material. Further understanding the defects structure and origins in sapphire plays a crucial role. This study is focusing on analyzing the structure of linear, 2D and 3D defects using the X-ray topography technique. Several other techniques such as etch pits method and X-ray reticulography are also employed to revealing the properties of dislocations and stress distribution around certain defect feature. | |
| dcterms.available | 2017-09-20T16:50:07Z | |
| dcterms.contributor | Venkatesh, T. A.. | en_US |
| dcterms.contributor | Dudley, Michael | en_US |
| dcterms.contributor | Raghothamachar, Balaji | en_US |
| dcterms.creator | Yang, Yu | |
| dcterms.dateAccepted | 2017-09-20T16:50:07Z | |
| dcterms.dateSubmitted | 2017-09-20T16:50:07Z | |
| dcterms.description | Department of Materials Science and Engineering. | en_US |
| dcterms.extent | 62 pg. | en_US |
| dcterms.format | Monograph | |
| dcterms.format | Application/PDF | en_US |
| dcterms.identifier | http://hdl.handle.net/11401/76365 | |
| dcterms.issued | 2012-12-01 | |
| dcterms.language | en_US | |
| dcterms.provenance | Made available in DSpace on 2017-09-20T16:50:07Z (GMT). No. of bitstreams: 1
Yang_grad.sunysb_0771M_11241.pdf: 5225169 bytes, checksum: fe852614d27cb2953442896ddda91571 (MD5)
Previous issue date: 1 | en |
| dcterms.publisher | The Graduate School, Stony Brook University: Stony Brook, NY. | |
| dcterms.subject | Materials Science | |
| dcterms.subject | dislocations, sapphire, X-ray Topography | |
| dcterms.title | Characterizations of Defects in Bulk Sapphire | |
| dcterms.type | Thesis | |
