dc.contributor.other | Preservation Department, Stony Brook University Libraries. | en_US |
dc.contributor.other | Cataloging & Metadata Department, Stony Brook University Libraries. | en_US |
dc.identifier.uri | http://hdl.handle.net/1951/37161 | |
dc.identifier.uri | http://hdl.handle.net/11401/65394 | |
dc.format | Monograph. | en_US |
dc.format.extent | 2837441 bytes | |
dc.format.medium | Electronic Resource. | en_US |
dc.language.iso | en_US | |
dc.rights | All Rights Reserved. Stony Brook University. | en_US |
dc.type | Technical Report | en_US |
dcterms.creator | Thampuran, D. V. | en_US |
dcterms.dateAccepted | 2007-07-17T16:53:04Z | |
dcterms.dateAccepted | 2015-04-24T14:27:01Z | |
dcterms.dateSubmitted | 2007-07-17T16:53:04Z | |
dcterms.dateSubmitted | 2015-04-24T14:27:01Z | |
dcterms.extent | leave(s) : ill; 28 cm. | en_US |
dcterms.format | application/pdf | |
dcterms.issued | 1970 | en_US |
dcterms.provenance | Made available in DSpace on 2007-07-17T16:53:04Z (GMT). No. of bitstreams: 1
CEAS--159.pdf: 2837441 bytes, checksum: 8652bdc5ec2a4dea2e0033b2a90f0f84 (MD5)
Previous issue date: 1970 | en |
dcterms.provenance | Made available in DSpace on 2015-04-24T14:27:01Z (GMT). No. of bitstreams: 3
CEAS--159.pdf.jpg: 1703 bytes, checksum: 04dc1e24538417bbec933b6fb29a2cdd (MD5)
CEAS--159.pdf.txt: 16690 bytes, checksum: c3be31de3004d9d349e0c02ca44af839 (MD5)
CEAS--159.pdf: 2837441 bytes, checksum: 8652bdc5ec2a4dea2e0033b2a90f0f84 (MD5)
Previous issue date: 1970 | en |
dcterms.publisher | Stony Brook, NY. | en_US |
dcterms.publisher | Stony Brook, N.Y.: State University of New York at Stony Brook, College of Engineering. | en_US |
dcterms.publisher | Stony Brook University. | en_US |
dcterms.title | Bitopological spaces and complete regularity | en_US |
dc.description.contributor | The content contained herein is maintained and curated by the Preservation Department. | en_US |
dc.description.contributor | This record is revised and maintained by the content administrators from the Cataloging & Metadata Department. | en_US |