dc.contributor.other | Preservation Department, Stony Brook University Libraries. | en_US |
dc.contributor.other | Cataloging & Metadata Department, Stony Brook University Libraries. | en_US |
dc.identifier.uri | http://hdl.handle.net/1951/37201 | |
dc.identifier.uri | http://hdl.handle.net/11401/65422 | |
dc.format | Monograph. | en_US |
dc.format.extent | 1141023 bytes | |
dc.format.medium | Electronic Resource. | en_US |
dc.language.iso | en_US | |
dc.rights | All Rights Reserved. Stony Brook University. | en_US |
dc.type | Technical Report | en_US |
dcterms.creator | Zhang, Yimin | en_US |
dcterms.creator | Zemanian, A. H.(Armen H.) | |
dcterms.dateAccepted | 2007-07-17T16:54:31Z | |
dcterms.dateAccepted | 2015-04-24T14:27:06Z | |
dcterms.dateSubmitted | 2007-07-17T16:54:31Z | |
dcterms.dateSubmitted | 2015-04-24T14:27:06Z | |
dcterms.extent | leave(s) : ill; 28 cm. | en_US |
dcterms.format | application/pdf | |
dcterms.issued | 1994 | en_US |
dcterms.provenance | Made available in DSpace on 2007-07-17T16:54:31Z (GMT). No. of bitstreams: 1
CEAS--696.pdf: 1141023 bytes, checksum: abbdf5f924c445050eba6ca7c4a668c0 (MD5)
Previous issue date: 1994 | en |
dcterms.provenance | Made available in DSpace on 2015-04-24T14:27:06Z (GMT). No. of bitstreams: 3
CEAS--696.pdf.jpg: 1251 bytes, checksum: eaa3d7e0799e4d5308f46a0cd15847da (MD5)
CEAS--696.pdf.txt: 33102 bytes, checksum: d113af85ca75b4e81c8f92ea53b8e759 (MD5)
CEAS--696.pdf: 1141023 bytes, checksum: abbdf5f924c445050eba6ca7c4a668c0 (MD5)
Previous issue date: 1994 | en |
dcterms.publisher | Stony Brook, NY. | en_US |
dcterms.publisher | Stony Brook, N.Y.: State University of New York at Stony Brook, College of Engineering. | en_US |
dcterms.publisher | Stony Brook University. | en_US |
dcterms.title | THREE-DIMENSIONAL CORNER SINGULARITIES IN VLSI CAPACITANCE ESTIMATION | en_US |
dc.description.contributor | The content contained herein is maintained and curated by the Preservation Department. | en_US |
dc.description.contributor | This record is revised and maintained by the content administrators from the Cataloging & Metadata Department. | en_US |