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dc.identifier.urihttp://hdl.handle.net/1951/55634
dc.identifier.urihttp://hdl.handle.net/11401/72677
dc.description.sponsorshipThis work is sponsored by the Stony Brook University Graduate School in compliance with the requirements for completion of degree.en_US
dc.formatMonograph
dc.format.mediumElectronic Resourceen_US
dc.language.isoen_US
dc.publisherThe Graduate School, Stony Brook University: Stony Brook, NY.
dc.typeDissertation
dcterms.abstractX-ray Diffraction Microscopy (XDM) has been gaining in popularity for nanoscale imaging of biological and material science samples. Its high penetration depth (compared to electron microscopy) and its good dose efficiency (compared to its lens-based X-ray alternative) make it uniquely suited for imaging whole biological specimens, where radiation damage is a concern. Despite these advantages, XDM is still far from being a routine imaging tool. This is due to the computational challenge of reconstructing an image from recorded diffraction intensities as well as difficult-to-satisfy experimental requirements. I address these challenges by improving on the computational methods and by implementing a more reliable experimental geometry for our existing diffraction microscope at the Advanced Light Source, Lawrence Berkeley Lab. First, a software library has been developed that streamlines the post-experiment processing of data and that improves on an important aspect of data analysis. Results will be shown that illustrate the collective improvement to the reconstruction process. A modified version of a tool commonly used to assess the consistency of reconstructions is proposed and criteria of its validity are derived. Results show that it has improved utility for judging reconstruction quality. Second, a scanning-type experimental setup has been implemented for our existing diffraction microscope. Several possible geometries are discussed and preliminary results from recent experimental data are shown.
dcterms.available2012-05-15T18:06:55Z
dcterms.available2015-04-24T14:53:11Z
dcterms.contributorAlexandre G. Abanoven_US
dcterms.contributorJacobsen, Chris J.en_US
dcterms.contributorAnand Sivaramakrishnanen_US
dcterms.contributorHanfei Yan.en_US
dcterms.creatorSteinbrener, Jan Felix
dcterms.dateAccepted2012-05-15T18:06:55Z
dcterms.dateAccepted2015-04-24T14:53:11Z
dcterms.dateSubmitted2012-05-15T18:06:55Z
dcterms.dateSubmitted2015-04-24T14:53:11Z
dcterms.descriptionDepartment of Physicsen_US
dcterms.formatApplication/PDFen_US
dcterms.formatMonograph
dcterms.identifierhttp://hdl.handle.net/1951/55634
dcterms.identifierSteinbrener_grad.sunysb_0771E_10184.pdfen_US
dcterms.identifierhttp://hdl.handle.net/11401/72677
dcterms.issued2010-08-01
dcterms.languageen_US
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dcterms.publisherThe Graduate School, Stony Brook University: Stony Brook, NY.
dcterms.subjectBiophysics, General Physics, Optics -- Physics, Radiation
dcterms.subjectCoherent diffractive imaging, X-ray diffraction microscopy
dcterms.titleX-ray Diffraction Microscopy: Computational Methods and Scanning-type Experiments
dcterms.typeDissertation


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