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Dudley, Michael (34)
Raghothamachar, Balaji (24)Venkatesh, T.A.. (9)Gersappe, Dilip (5)Sokolov, Jonathan (4)Venkatesh, T. A.. (4)Bouet, Nathalie. (3)Conley, Raymond (3)GOUE, Ouloide Yannick (3)Hossain, Anwar. (3)... View MoreSubjectMaterials Science (26)4H-SiC, Dislocations, Line direction (3)Cadmium overpressure, Crystal growth, Defect characterization, Minority carrier lifetime, silicon carbide, cadmium zinc telluride, Wide band-gap materials (3)defects, III-nitrides, semiconductor, synchrotron X-ray topography (3)Engineering -- Materials Science (3)HRXRD, semiconductor, x-ray topography (3)Optics -- Materials Science -- Engineering (3)alkali antimonide (1)blend thin films, PEO/PS, scCO2 (1)Boron Phosphide thin films, crystal quality, sapphire single crystal, SEM, Synchrotron X-ray Topography (1)... View MoreDate Issued2016 (9)2017 (8)2014 (6)2012 (5)2013 (4)2011 (1)2015 (1)Has File(s)Yes (34)